As markets and technologies grow increasingly interconnected around the world, IP litigants, both plaintiffs, and defendants are reorienting their litigation strategies to reflect global realities. At the same time, changes in the legal landscape in the U.S., Europe, and Asia are giving rise to both new risks and new opportunities for IP litigation. Rapidly evolving case law, new guidelines from national competition authorities and other institutions, and legislative initiatives constantly shape and reshape the ever more complex framework for both plaintiffs and defendants.
The Sedona Conference will address the new challenges in Global IP Litigation. HKA Partner Paul Meyer will be part of a panel at the conference where he will be contributing to discussions on SEP/FRAND matters alongside a faculty of distinguished attorneys and judicial officials.
Paul K. Meyer, Partner, attended the University of Virginia and is a Certified Public Accountant (California and Virginia), Certified in Business Valuation (CPA-ABV), a Certified Licensing Professional (CLP), and a Certified Fraud Examiner (CFE). Paul is a Consulting Professor at Stanford University where he teaches a graduate course in the School of Engineering and is a member of the Advisory Board at the University of Virginia McIntire School Of Commerce. He has provided expertise and analyses on intellectual property valuation and licensing matters in a wide range of industries including numerous high technology assignments. Paul’s extensive intellectual property experience includes analyzing financial and economic damages related to alleged infringement and misappropriation of patents, trademarks, copyrights and trade secrets. He has testified in over 200 depositions, and approximately 70 trials and major arbitrations, including 35 jury trials. Paul’s testimony has included federal and state court, the London Court of International Arbitration, and the International Trade Commission. Paul is a member of the Steering Committee for The Sedona Conference Working Group 9 on Patent Damages and Remedies (WG9) and Working Group 10 on Patent Litigation Best Practices (WG10).
